Report date: Dec 2,2025
Conflict count: 369596
Publisher: Elsevier
Title count: 963
Conflict count: 17920


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Created: 2004-12-15 01:52:16
ConfID: 4659394
CauseID: 137032350
OtherID: 46142130
JT: Microelectronic Engineering
MD: ,,,,2004,Contents
DOI: 10.1016/j.mee.2003.12.007(Journal) (4659394-N)
DOI: 10.1016/j.mee.2004.07.010(Journal)