Report date: Dec 2,2025
Conflict count: 369596
Publisher: Institute of Electrical and Electronics Engineers
Title count: 2
Conflict count: 3


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Created: 2025-01-27 13:40:38
ConfID: 7809764
CauseID: 1668607311
OtherID: 1486518775
JT: Chinese Journal of Electronics
MD: Wang,29,3,437,2020,Remote Attestation for Intelligent Electronic Devices in Smart Grid Based on Trusted Level Measurement
DOI: 10.1049/2020.02.019(Journal) (7809764-N)
DOI: 10.1049/cje.2020.02.019(Journal)