Report date: Jan 27,2026 Conflict count: 370687 Publisher: Department of Computer Engineering, Faculty of Computer Science, Universitas Sriwijaya Title count: 1 Conflict count: 5 ========================================================== Created: 2025-10-13 18:02:53 ConfID: 8356879 CauseID: 1716344383 OtherID: 1650341288 JT: Computer Engineering and Applications Journal MD: Gunawan,13,3,34,2024,Imbalanced Data NearMiss for Comparison of SVM and Naive Bayes Algorithms DOI: 10.18495/comengapp.v13i03.485(Journal) (8356879-N) DOI: 10.18495/comengapp.v13i3.485(Journal) ========================================================== Created: 2025-10-13 18:02:53 ConfID: 8356878 CauseID: 1716344383 OtherID: 1650341288 JT: Computer Engineering and Applications Journal MD: Nasrudin,13,3,1,2024,MRI-Based Brain Tumor Instance Segmentation Using Mask R-CNN DOI: 10.18495/comengapp.v13i03.490(Journal) (8356878-N) DOI: 10.18495/comengapp.v13i3.490(Journal) ========================================================== Created: 2025-10-13 18:02:53 ConfID: 8356877 CauseID: 1716344383 OtherID: 1650341288 JT: Computer Engineering and Applications Journal MD: Sari,13,3,25,2024,Fake News Detection Using Optimized Convolutional Neural Network and Bidirectional Long Short-Term Memory DOI: 10.18495/comengapp.v13i03.492(Journal) (8356877-N) DOI: 10.18495/comengapp.v13i3.492(Journal) ========================================================== Created: 2025-10-13 18:02:53 ConfID: 8356876 CauseID: 1716344383 OtherID: 1650341288 JT: Computer Engineering and Applications Journal MD: Zarkasi,13,3,44,2024,The Eye and Nose Identification Chip Controller-Based on Robot Vision Using Weightless Neural Network Method DOI: 10.18495/comengapp.v13i03.615(Journal) (8356876-N) DOI: 10.18495/comengapp.v13i3.615(Journal) ========================================================== Created: 2025-10-13 18:02:53 ConfID: 8356880 CauseID: 1716344383 OtherID: 1650341288 JT: Computer Engineering and Applications Journal MD: Geovani,13,3,10,2024,CLUSTER ANALYSIS OF OBESITY RISK LEVELS USING K-MEANS AND DBSCAN METHODS DOI: 10.18495/comengapp.v13i03.481(Journal) (8356880-N) DOI: 10.18495/comengapp.v13i3.481(Journal)