Report date: Dec 2,2025
Conflict count: 369596
Publisher: Institute of Electrical and Electronics Engineers
Title count: 23
Conflict count: 168


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Created: 2025-04-14 13:37:33
ConfID: 8051266
CauseID: 1690835069
OtherID: 1690835058
JT: IEEE Transactions on Plasma Science
MD: ,53,4,1,2025,Table of Contents
DOI: 10.1109/TPS.2025.3557728(Journal) (8051266-N)
DOI: 10.1109/TPS.2025.3556609(Journal)
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Created: 2025-04-14 13:37:33
ConfID: 8051267
CauseID: 1690835069
OtherID: 1690835058
JT: IEEE Transactions on Plasma Science
MD: ,53,4,4,2025,Blank Page
DOI: 10.1109/TPS.2025.3557724(Journal) (8051267-N)
DOI: 10.1109/TPS.2025.3556605(Journal)
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Created: 2025-04-14 13:37:33
ConfID: 8051264
CauseID: 1690835069
OtherID: 1690835058
JT: IEEE Transactions on Plasma Science
MD: ,53,4,2,2025,IEEE Transactions on Plasma Science Publication Information
DOI: 10.1109/TPS.2025.3557722(Journal) (8051264-N)
DOI: 10.1109/TPS.2025.3556603(Journal)
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Created: 2025-04-14 13:37:33
ConfID: 8051265
CauseID: 1690835069
OtherID: 1690835058
JT: IEEE Transactions on Plasma Science
MD: ,53,4,3,2025,IEEE Transactions on Plasma Science Information for Authors
DOI: 10.1109/TPS.2025.3557726(Journal) (8051265-N)
DOI: 10.1109/TPS.2025.3556607(Journal)
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Created: 2025-10-14 17:39:42
ConfID: 8358657
CauseID: 1716471781
OtherID: 1716471782
JT: IEEE Transactions on Plasma Science
MD: ,53,10,3,2025,IEEE Transactions on Plasma Science information for authors
DOI: 10.1109/TPS.2025.3616470(Journal) (8358657-N)
DOI: 10.1109/TPS.2025.3616490(Journal)
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Created: 2025-10-14 17:39:42
ConfID: 8358656
CauseID: 1716471781
OtherID: 1716471782
JT: IEEE Transactions on Plasma Science
MD: ,53,10,2,2025,Transactions on Plasma Science
DOI: 10.1109/TPS.2025.3616468(Journal) (8358656-N)
DOI: 10.1109/TPS.2025.3616492(Journal)
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Created: 2025-10-14 17:39:43
ConfID: 8358637
CauseID: 1716471782
OtherID: 1716471781
JT: IEEE Transactions on Plasma Science
MD: ,53,10,1,2025,Table of Contents
DOI: 10.1109/TPS.2025.3616466(Journal) (8358637-N)
DOI: 10.1109/TPS.2025.3616488(Journal)
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Created: 2025-10-14 17:39:43
ConfID: 8358636
CauseID: 1716471782
OtherID: 1716471781
JT: IEEE Transactions on Plasma Science
MD: ,53,10,4,2025,Blank Page
DOI: 10.1109/TPS.2025.3616472(Journal) (8358636-N)
DOI: 10.1109/TPS.2025.3616486(Journal)