Report date: Apr 21,2026
Conflict count: 377241
Publisher: Institute of Electrical and Electronics Engineers
Title count: 12
Conflict count: 81


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Created: 2026-04-16 19:52:38
ConfID: 8781337
CauseID: 1742181133
OtherID: 1742181129
JT: IEEE Transactions on Plasma Science
MD: ,54,4,2,2026,Transactions on Plasma Science
DOI: 10.1109/TPS.2026.3679157(Journal) (8781337-N)
DOI: 10.1109/TPS.2026.3679149(Journal)
DOI: 10.1109/TPS.2026.3679205(Journal)
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Created: 2026-04-16 19:52:38
ConfID: 8781336
CauseID: 1742181133
OtherID: 1742181129
JT: IEEE Transactions on Plasma Science
MD: ,54,4,1,2026,Table of Contents
DOI: 10.1109/TPS.2026.3679155(Journal) (8781336-N)
DOI: 10.1109/TPS.2026.3679147(Journal)
DOI: 10.1109/TPS.2026.3679163(Journal)
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Created: 2026-04-16 19:52:38
ConfID: 8781338
CauseID: 1742181133
OtherID: 1742181129
JT: IEEE Transactions on Plasma Science
MD: ,54,4,3,2026,IEEE Transactions on Plasma Science information for authors
DOI: 10.1109/TPS.2026.3679159(Journal) (8781338-N)
DOI: 10.1109/TPS.2026.3679151(Journal)
DOI: 10.1109/TPS.2026.3679207(Journal)
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Created: 2026-04-16 19:52:38
ConfID: 8781356
CauseID: 1742181133
OtherID: 1742181130
JT: IEEE Transactions on Plasma Science
MD: ,54,4,4,2026,Blank Page
DOI: 10.1109/TPS.2026.3679161(Journal) (8781356-N)
DOI: 10.1109/TPS.2026.3679153(Journal)
DOI: 10.1109/TPS.2026.3679209(Journal)
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Created: 2026-03-17 20:22:57
ConfID: 8701416
CauseID: 1737620681
OtherID: 1737620682
JT: IEEE Transactions on Plasma Science
MD: ,54,3,4,2026,Blank Page
DOI: 10.1109/TPS.2026.3669327(Journal) (8701416-N)
DOI: 10.1109/TPS.2026.3670997(Journal)
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Created: 2026-03-17 20:22:58
ConfID: 8701436
CauseID: 1737620682
OtherID: 1737620681
JT: IEEE Transactions on Plasma Science
MD: ,54,3,3,2026,IEEE Transactions on Plasma Science information for authors
DOI: 10.1109/TPS.2026.3669325(Journal) (8701436-N)
DOI: 10.1109/TPS.2026.3670995(Journal)
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Created: 2026-03-17 20:22:58
ConfID: 8701437
CauseID: 1737620682
OtherID: 1737620681
JT: IEEE Transactions on Plasma Science
MD: ,54,3,2,2026,Transactions on Plasma Science
DOI: 10.1109/TPS.2026.3670993(Journal) (8701437-N)
DOI: 10.1109/TPS.2026.3669323(Journal)
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Created: 2026-03-17 20:22:58
ConfID: 8701438
CauseID: 1737620682
OtherID: 1737620681
JT: IEEE Transactions on Plasma Science
MD: ,54,3,1,2026,Table of Contents
DOI: 10.1109/TPS.2026.3670991(Journal) (8701438-N)
DOI: 10.1109/TPS.2026.3669321(Journal)