Report date: Nov 6,2024
Conflict count: 361874
Publisher: Institute of Electrical and Electronics Engineers
Title count: 25
Conflict count: 194


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Created: 2024-06-21 13:21:11
ConfID: 7358020
CauseID: 1634515984
OtherID: 1634515986
JT: IEEE Transactions on Plasma Science
MD: ,52,4,3,2024,IEEE Transactions on Plasma Science Information for Authors
DOI: 10.1109/TPS.2024.3383713(Journal) (7358020-N)
DOI: 10.1109/TPS.2024.3409953(Journal)
DOI: 10.1109/TPS.2024.3409975(Journal)
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Created: 2024-06-21 13:21:11
ConfID: 7358021
CauseID: 1634515984
OtherID: 1634515985
JT: IEEE Transactions on Plasma Science
MD: ,52,4,1,2024,Table of Contents
DOI: 10.1109/TPS.2024.3409955(Journal) (7358021-N)
DOI: 10.1109/TPS.2024.3383709(Journal)
DOI: 10.1109/TPS.2024.3409971(Journal)
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Created: 2024-06-21 13:21:13
ConfID: 7358022
CauseID: 1634515986
OtherID: 1634515985
JT: IEEE Transactions on Plasma Science
MD: ,52,4,4,2024,Blank Page
DOI: 10.1109/TPS.2024.3409951(Journal) (7358022-N)
DOI: 10.1109/TPS.2024.3409973(Journal)
DOI: 10.1109/TPS.2024.3383715(Journal)
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Created: 2024-06-21 13:21:11
ConfID: 7358023
CauseID: 1634515984
OtherID: 1634515985
JT: IEEE Transactions on Plasma Science
MD: ,52,4,2,2024,IEEE Transactions on Plasma Science Publication Information
DOI: 10.1109/TPS.2024.3409949(Journal) (7358023-N)
DOI: 10.1109/TPS.2024.3383711(Journal)
DOI: 10.1109/TPS.2024.3409969(Journal)