Report date: Nov 6,2024
Conflict count: 361874
Publisher: Institute of Electrical and Electronics Engineers
Title count: 25
Conflict count: 194


==========================================================

Created: 2024-04-18 13:21:40
ConfID: 7277637
CauseID: 1624796709
OtherID: 1624796701
JT: IEEE Transactions on Nuclear Science
MD: ,71,4,4,2024,Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society
DOI: 10.1109/TNS.2024.3384886(Journal) (7277637-N)
DOI: 10.1109/TNS.2024.3384820(Journal)
==========================================================

Created: 2024-04-18 13:21:40
ConfID: 7277636
CauseID: 1624796709
OtherID: 1624796701
JT: IEEE Transactions on Nuclear Science
MD: ,71,4,2,2024,IEEE Transactions on Nuclear Science publication information
DOI: 10.1109/TNS.2024.3384897(Journal) (7277636-N)
DOI: 10.1109/TNS.2024.3384720(Journal)
==========================================================

Created: 2024-04-18 13:21:39
ConfID: 7277635
CauseID: 1624796701
OtherID: 1624796709
JT: IEEE Transactions on Nuclear Science
MD: ,71,4,3,2024,IEEE Transactions on Nuclear Science information for authors
DOI: 10.1109/TNS.2024.3384819(Journal) (7277635-N)
DOI: 10.1109/TNS.2024.3384898(Journal)
==========================================================

Created: 2024-05-17 13:20:16
ConfID: 7312469
CauseID: 1629311862
OtherID: 1629311861
JT: IEEE Transactions on Nuclear Science
MD: ,71,5,4,2024,Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society
DOI: 10.1109/TNS.2024.3397300(Journal) (7312469-N)
DOI: 10.1109/TNS.2024.3396771(Journal)
==========================================================

Created: 2024-05-17 13:20:16
ConfID: 7312468
CauseID: 1629311862
OtherID: 1629311861
JT: IEEE Transactions on Nuclear Science
MD: ,71,5,2,2024,IEEE Transactions on Nuclear Science publication information
DOI: 10.1109/TNS.2024.3397298(Journal) (7312468-N)
DOI: 10.1109/TNS.2024.3396769(Journal)
==========================================================

Created: 2024-05-17 13:20:16
ConfID: 7312467
CauseID: 1629311862
OtherID: 1629311861
JT: IEEE Transactions on Nuclear Science
MD: ,71,5,3,2024,IEEE Transactions on Nuclear Science information for authors
DOI: 10.1109/TNS.2024.3397299(Journal) (7312467-N)
DOI: 10.1109/TNS.2024.3396770(Journal)
==========================================================

Created: 2024-08-16 13:19:12
ConfID: 7444704
CauseID: 1643620878
OtherID: 1643620877
JT: IEEE Transactions on Nuclear Science
MD: ,71,8,2,2024,IEEE Transactions on Nuclear Science publication information
DOI: 10.1109/TNS.2024.3437968(Journal) (7444704-N)
DOI: 10.1109/TNS.2024.3437928(Journal)
==========================================================

Created: 2024-08-16 13:19:12
ConfID: 7444701
CauseID: 1643620878
OtherID: 1643620877
JT: IEEE Transactions on Nuclear Science
MD: ,71,8,3,2024,IEEE Transactions on Nuclear Science information for authors
DOI: 10.1109/TNS.2024.3437969(Journal) (7444701-N)
DOI: 10.1109/TNS.2024.3437929(Journal)
==========================================================

Created: 2024-08-16 13:19:12
ConfID: 7444703
CauseID: 1643620878
OtherID: 1643620877
JT: IEEE Transactions on Nuclear Science
MD: ,71,8,4,2024,Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society
DOI: 10.1109/TNS.2024.3437970(Journal) (7444703-N)
DOI: 10.1109/TNS.2024.3437930(Journal)