Report date: Jan 6,2026 Conflict count: 370383 Publisher: Institute of Electrical and Electronics Engineers Title count: 4 Conflict count: 15 ========================================================== Created: 2025-12-29 18:37:55 ConfID: 8560196 CauseID: 1727235332 OtherID: 1727235314 JT: IEEE/ASME Transactions on Mechatronics MD: ,30,6,3,2025,IEEE/ASME Transactions on Mechatronics Information for Authors DOI: 10.1109/TMECH.2025.3643776(Journal) (8560196-N) DOI: 10.1109/TMECH.2025.3643768(Journal) DOI: 10.1109/TMECH.2025.3640740(Journal) DOI: 10.1109/TMECH.2025.3643760(Journal) ========================================================== Created: 2025-12-29 18:37:55 ConfID: 8560236 CauseID: 1727235332 OtherID: 1727235331 JT: IEEE/ASME Transactions on Mechatronics MD: ,30,6,1,2025,Table of Contents DOI: 10.1109/TMECH.2025.3643772(Journal) (8560236-N) DOI: 10.1109/TMECH.2025.3640736(Journal) DOI: 10.1109/TMECH.2025.3643764(Journal) DOI: 10.1109/TMECH.2025.3643756(Journal) ========================================================== Created: 2025-12-29 18:37:52 ConfID: 8560216 CauseID: 1727235315 OtherID: 1727235331 JT: IEEE/ASME Transactions on Mechatronics MD: ,30,6,2,2025,IEEE/ASME Transactions on Mechatronics Publication Information DOI: 10.1109/TMECH.2025.3643758(Journal) (8560216-N) DOI: 10.1109/TMECH.2025.3643774(Journal) DOI: 10.1109/TMECH.2025.3640738(Journal) DOI: 10.1109/TMECH.2025.3643766(Journal) ========================================================== Created: 2025-12-29 18:37:52 ConfID: 8560217 CauseID: 1727235315 OtherID: 1727235331 JT: IEEE/ASME Transactions on Mechatronics MD: ,30,6,4,2025,Blank Page DOI: 10.1109/TMECH.2025.3643762(Journal) (8560217-N) DOI: 10.1109/TMECH.2025.3643778(Journal) DOI: 10.1109/TMECH.2025.3640742(Journal) DOI: 10.1109/TMECH.2025.3643770(Journal)