Report date: Feb 4,2025
Conflict count: 357963
Publisher: Institute of Electrical and Electronics Engineers
Title count: 26
Conflict count: 283


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Created: 2024-11-29 13:52:16
ConfID: 7696504
CauseID: 1658537117
JT: IEEE Instrumentation & Measurement Magazine
MD: ,27,9,1,2024,Call for Papers
DOI: 10.1109/MIM.2024.10771983(Journal) (7696504-N)
DOI: 10.1109/MIM.2024.10772044(Journal)
DOI: 10.1109/MIM.2024.10772025(Journal)
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Created: 2025-02-03 13:26:48
ConfID: 7829404
CauseID: 1670606192
JT: IEEE Instrumentation & Measurement Magazine
MD: ,28,1,1,2025,Call for Papers
DOI: 10.1109/MIM.2025.10870091(Journal) (7829404-N)
DOI: 10.1109/MIM.2025.10870087(Journal)
DOI: 10.1109/MIM.2025.10870093(Journal)