Report date: Sep 3, 2024
Conflict count: 360612
Publisher: Elsevier 
Title count: 937
Conflict count: 15231


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Created: 2024-07-05 08:31:08.0
ConfID: 7366939
CauseID: 1636502393
OtherID: 1636502391
JT: Microelectronics Journal
MD: Jowett, 12 ,4,43,1981,Book Review
DOI: 10.1016/S0026-2692(81)80297-2(Journal) (7366939-N )
DOI: 10.1016/S0026-2692(81)80298-4(Journal)
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Created: 2024-07-05 08:53:25.0
ConfID: 7366940
CauseID: 1636508261
OtherID: 1636508240
JT: Microelectronics Journal
MD: Walker, 13 ,2,35,1982,Book Review
DOI: 10.1016/S0026-2692(82)80195-X(Journal) (7366940-N )
DOI: 10.1016/S0026-2692(82)80197-3(Journal)
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Created: 2024-07-05 10:17:45.0
ConfID: 7366943
CauseID: 1636515449
OtherID: 1636515448
JT: Microelectronics Journal
MD: null, 30 ,3,293,1999,Book review
DOI: 10.1016/S0026-2692(98)00121-9(Journal) (7366943-N )
DOI: 10.1016/S0026-2692(98)00122-0(Journal)
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Created: 2024-07-05 16:22:46.0
ConfID: 7366962
CauseID: 1636541032
OtherID: 1636541031
JT: Microelectronics Journal
MD: Krejcik, 14 ,4,59,1983,Book Review
DOI: 10.1016/S0026-2692(83)80009-3(Journal) (7366962-N )
DOI: 10.1016/S0026-2692(83)80010-X(Journal)
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Created: 2024-07-05 16:41:43.0
ConfID: 7366963
CauseID: 1636545932
OtherID: 1636545930
JT: Microelectronics Journal
MD: Butcher, 15 ,2,71,1984,Book review
DOI: 10.1016/S0026-2692(84)80036-1(Journal) (7366963-N )
DOI: 10.1016/S0026-2692(84)80037-3(Journal)
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Created: 2024-07-05 17:14:11.0
ConfID: 7366965
CauseID: 1636551184
OtherID: 1636551179
JT: Microelectronics Journal
MD: null, 30 ,1,83,1999,Book review
DOI: 10.1016/S0026-2692(97)00086-4(Journal) (7366965-N )
DOI: 10.1016/S0026-2692(97)00087-6(Journal)
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Created: 2024-07-05 17:17:36.0
ConfID: 7366966
CauseID: 1636551464
OtherID: 1636551425
JT: Microelectronics Journal
MD: null, 30 ,1,84,1999,Book review
DOI: 10.1016/S0026-2692(98)00069-X(Journal) (7366966-N )
DOI: 10.1016/S0026-2692(98)00009-3(Journal)
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Created: 2024-07-05 17:18:07.0
ConfID: 7366967
CauseID: 1636551503
OtherID: 1636551502
JT: Microelectronics Journal
MD: null, 30 ,1,86,1999,Book review
DOI: 10.1016/S0026-2692(98)00089-5(Journal) (7366967-N )
DOI: 10.1016/S0026-2692(98)00090-1(Journal)
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Created: 2024-07-05 21:41:33.0
ConfID: 7366974
CauseID: 1636575381
OtherID: 1636575380
JT: Microelectronics Journal
MD: null, 30 ,2,207,1999,Book review
DOI: 10.1016/S0026-2692(98)00116-5(Journal) (7366974-N )
DOI: 10.1016/S0026-2692(98)00095-0(Journal)
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Created: 2024-07-05 21:41:37.0
ConfID: 7366975
CauseID: 1636575394
OtherID: 1636575392
JT: Microelectronics Journal
MD: null, 30 ,2,209,1999,Book review
DOI: 10.1016/S0026-2692(98)00120-7(Journal) (7366975-N )
DOI: 10.1016/S0026-2692(98)00119-0(Journal)
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Created: 2024-07-08 16:21:51.0
ConfID: 7367525
CauseID: 1636881028
OtherID: 1636881015
JT: Microelectronics Journal
MD: Weatherley, 10 ,3,43,1979,Book Review
DOI: 10.1016/S0026-2692(79)80050-6(Journal) (7367525-N )
DOI: 10.1016/S0026-2692(79)80051-8(Journal)
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Created: 2024-07-08 16:31:37.0
ConfID: 7367527
CauseID: 1636883635
OtherID: 1636883445, 1636883637
JT: Microelectronics Journal
MD: Weatherley, 11 ,3,39,1980,Book Review
DOI: 10.1016/S0026-2692(80)80132-7(Journal) (7367527-N )
DOI: 10.1016/S0026-2692(80)80135-2(Journal)