Report date: Nov 6,2024
Conflict count: 361874
Publisher: Elsevier
Title count: 938
Conflict count: 15239


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Created: 2019-11-30 16:16:53
ConfID: 5559252
CauseID: 1459178433
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Tatchyn,1,1,79,1989,Generation of soft X-ray/VUV photons with a hybrid/bias micropole undulator on the LLNL linac
DOI: 10.1016/0895-3996(89)90032-3(Journal) (5559252-N)
==========================================================

Created: 2019-11-30 16:16:59
ConfID: 5559253
CauseID: 1459178438
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Gray,1,1,99,1989,Measured response of multilayers to damaging fluxes
DOI: 10.1016/0895-3996(89)90033-5(Journal) (5559253-N)
==========================================================

Created: 2019-11-30 16:17:08
ConfID: 5559254
CauseID: 1459178447
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Bonse,1,1,107,1989,Scanning interferometer for the measurement of anomalous dispersion with synchrotron X rays
DOI: 10.1016/0895-3996(89)90034-7(Journal) (5559254-N)
==========================================================

Created: 2019-11-30 16:17:19
ConfID: 5559255
CauseID: 1459178457
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Schwarzenberger,1,2,134,1989,Phase measurement X-ray interferometry
DOI: 10.1016/0895-3996(89)90036-0(Journal) (5559255-N)
==========================================================

Created: 2019-11-30 16:16:33
ConfID: 5559249
CauseID: 1459178415
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Knight,1,1,1,1989,Editorial
DOI: 10.1016/0895-3996(89)90029-3(Journal) (5559249-N)
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Created: 2019-11-30 16:16:38
ConfID: 5559250
CauseID: 1459178423
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Baez,1,1,3,1989,The early days of X-ray optics—A personal memoir
DOI: 10.1016/0895-3996(89)90030-X(Journal) (5559250-N)
==========================================================

Created: 2019-11-30 16:16:44
ConfID: 5559251
CauseID: 1459178428
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Ceglio,1,1,7,1989,Revolution in X-ray optics
DOI: 10.1016/0895-3996(89)90031-1(Journal) (5559251-N)
==========================================================

Created: 2019-11-30 16:17:54
ConfID: 5559260
CauseID: 1459178487
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Shealy,1,2,190,1989,Design of a normal incidence multilayer imaging X-ray microscope
DOI: 10.1016/0895-3996(89)90041-4(Journal) (5559260-N)
==========================================================

Created: 2019-11-30 16:18:03
ConfID: 5559261
CauseID: 1459178493
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Ford,1,2,207,1989,Improved resolution of soft X-ray contact images using laser-produced plasmas
DOI: 10.1016/0895-3996(89)90042-6(Journal) (5559261-N)
==========================================================

Created: 2019-11-30 16:18:19
ConfID: 5559262
CauseID: 1459178506
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Michette,2,1,1,1990,Laser-generated plasmas: Source requirements for x-ray microscopy
DOI: 10.1016/0895-3996(90)90001-3(Journal) (5559262-N)
==========================================================

Created: 2019-11-30 16:18:23
ConfID: 5559263
CauseID: 1459178511
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Henke,2,1,17,1990,Design and characterization of x-ray multilayer analyzers for the 50–1000 eV region
DOI: 10.1016/0895-3996(90)90002-4(Journal) (5559263-N)
==========================================================

Created: 2019-11-30 16:17:28
ConfID: 5559256
CauseID: 1459178462
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Allinson,1,2,143,1989,Charge coupled device (CCD) area detector for on-line (40- to 80-ms) acquisition of Laue diffraction data from protein crystals
DOI: 10.1016/0895-3996(89)90037-2(Journal) (5559256-N)
==========================================================

Created: 2019-11-30 16:17:34
ConfID: 5559257
CauseID: 1459178467
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Tsacoyeanes,1,2,154,1989,Diamond vs beryllium films for improving survivability of metal mirrors against X rays
DOI: 10.1016/0895-3996(89)90038-4(Journal) (5559257-N)
==========================================================

Created: 2019-11-30 16:17:44
ConfID: 5559258
CauseID: 1459178479
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Goodman,1,2,162,1989,A comparison of DEF X-ray film and a photodiode array (Reticon) as detectors for an X-ray crystal spectrometer
DOI: 10.1016/0895-3996(89)90039-6(Journal) (5559258-N)
==========================================================

Created: 2019-11-30 16:17:48
ConfID: 5559259
CauseID: 1459178481
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Tjahjadi,1,2,171,1989,The use of color in image enhancement of X-ray microtomographs
DOI: 10.1016/0895-3996(89)90040-2(Journal) (5559259-N)
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Created: 2019-11-30 16:21:09
ConfID: 5559284
CauseID: 1459178651
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Voss,3,2,85,1992,A scanning soft x-ray microscope with an ellipsoidal focusing mirror
DOI: 10.1016/0895-3996(92)90002-2(Journal) (5559284-N)
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Created: 2019-11-30 16:21:19
ConfID: 5559285
CauseID: 1459178660
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Boher,3,2,118,1992,Tungsten/magnesium silicide multilayers for soft x-ray optics
DOI: 10.1016/0895-3996(92)90004-4(Journal) (5559285-N)
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Created: 2019-11-30 16:21:34
ConfID: 5559286
CauseID: 1459178670
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Graeff,3,2,152,1992,Synchrotron radiation white beam topography with an oscillating monochromator
DOI: 10.1016/0895-3996(92)90006-6(Journal) (5559286-N)
==========================================================

Created: 2019-11-30 16:21:39
ConfID: 5559287
CauseID: 1459178678
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Kalata,3,3,157,1992,The detective quantum efficiency of television X-ray detectors
DOI: 10.1016/0895-3996(92)90007-7(Journal) (5559287-N)
==========================================================

Created: 2019-11-30 16:20:39
ConfID: 5559280
CauseID: 1459178625
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Elsner,3,1,35,1991,Effective area of the AXAF X-Ray telescope: Dependence upon dielectric constants of coating materials
DOI: 10.1016/0895-3996(91)90010-4(Journal) (5559280-N)
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Created: 2019-11-30 16:20:48
ConfID: 5559281
CauseID: 1459178631
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Khan Malek,3,1,45,1991,A review of microfabrication technologies: Application to X-ray optics
DOI: 10.1016/0895-3996(91)90011-T(Journal) (5559281-N)
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Created: 2019-11-30 16:20:53
ConfID: 5559282
CauseID: 1459178636
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Harvey,3,1,68,1991,Diffraction effects in grazing incidence X-ray telescopes
DOI: 10.1016/0895-3996(91)90012-U(Journal) (5559282-N)
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Created: 2019-11-30 16:20:59
ConfID: 5559283
CauseID: 1459178642
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Speller,3,2,77,1992,Tissue characterization using low angle x-ray scattering
DOI: 10.1016/0895-3996(92)90001-Z(Journal) (5559283-N)
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Created: 2019-11-30 16:22:19
ConfID: 5559292
CauseID: 1459178711
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Allred,3,3,222,1992,Raman spectroscopic analysis of Mo/Si multilayers
DOI: 10.1016/0895-3996(92)90013-A(Journal) (5559292-N)
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Created: 2019-11-30 16:22:33
ConfID: 5559293
CauseID: 1459178721
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: MacGowan,3,4,231,1992,Investigation of damage to multilayer optics in x-ray laser cavities: W/C, WRe/C, WC/C, stainless-steel/C, and Cr3C2/C mirrors
DOI: 10.1016/0895-3996(92)90015-C(Journal) (5559293-N)
==========================================================

Created: 2019-11-30 16:22:44
ConfID: 5559294
CauseID: 1459178729
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Gullikson,3,4,283,1992,A soft x-ray/EUV reflectometer based on a laser produced plasma source
DOI: 10.1016/0895-3996(92)90016-D(Journal) (5559294-N)
==========================================================

Created: 2019-11-30 16:22:48
ConfID: 5559295
CauseID: 1459178736
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Zukowski,3,4,300,1992,Magnetic form factor of nickel determined by white beam x-ray diffraction
DOI: 10.1016/0895-3996(92)90017-E(Journal) (5559295-N)
==========================================================

Created: 2019-11-30 16:21:53
ConfID: 5559288
CauseID: 1459178687
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Dhez,3,3,176,1992,Multilayer X-ray mirror calibration by an energy dispersive method using an X-ray tube and a Si(Li) detector: Absolute reflectivity, energy band pass, and overlapping order determination
DOI: 10.1016/0895-3996(92)90009-9(Journal) (5559288-N)
==========================================================

Created: 2019-11-30 16:21:59
ConfID: 5559289
CauseID: 1459178692
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Ceglio,3,3,194,1992,Wafer cost analysis for a Soft X-Ray Projection Lithography system
DOI: 10.1016/0895-3996(92)90010-H(Journal) (5559289-N)
==========================================================

Created: 2019-11-30 16:22:08
ConfID: 5559290
CauseID: 1459178698
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Filatova,3,3,204,1992,The Yoneda effect in the region of ultrasoft X-ray radiation
DOI: 10.1016/0895-3996(92)90011-8(Journal) (5559290-N)
==========================================================

Created: 2019-11-30 16:22:14
ConfID: 5559291
CauseID: 1459178706
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Aristov,3,3,211,1992,Dynamic X-ray diffraction by a multilayer mirror modulated with a transverse acoustic wave
DOI: 10.1016/0895-3996(92)90012-9(Journal) (5559291-N)
==========================================================

Created: 2019-11-30 16:19:03
ConfID: 5559268
CauseID: 1459178545
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Karabekov,2,3,161,1990,Investigation of crystal perfection by measuring the collimating slit image widening in diffracted synchrotron radiation
DOI: 10.1016/0895-3996(90)90008-A(Journal) (5559268-N)
==========================================================

Created: 2019-11-30 16:19:09
ConfID: 5559269
CauseID: 1459178550
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Partanen,2,3,165,1990,An experimental and theoretical study of pendellösung fringes in synchrotron section topographs of silicon wafers
DOI: 10.1016/0895-3996(90)90009-B(Journal) (5559269-N)
==========================================================

Created: 2019-11-30 16:19:19
ConfID: 5559270
CauseID: 1459178556
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Stead,2,3,172,1990,Soft x-ray contact microscopy of biological specimens: Aluminum-coated silicon nitride windows as XUV filters
DOI: 10.1016/0895-3996(90)90010-J(Journal) (5559270-N)
==========================================================

Created: 2019-11-30 16:19:24
ConfID: 5559271
CauseID: 1459178564
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Davis,2,3,180,1990,DuMond diagram mappings for multi asymmetric crystal monochromators
DOI: 10.1016/0895-3996(90)90011-A(Journal) (5559271-N)
==========================================================

Created: 2019-11-30 16:18:34
ConfID: 5559264
CauseID: 1459178519
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Christensen,2,2,81,1990,Studies of multilayers and thin-foil X-ray mirrors using a soft X-ray diffractometer
DOI: 10.1016/0895-3996(90)90003-5(Journal) (5559264-N)
==========================================================

Created: 2019-11-30 16:18:35
ConfID: 5559265
CauseID: 1459178520
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Niu,2,2,95,1990,A new three-dimensional reconstruction method using algebraic reconstruction techniques
DOI: 10.1016/0895-3996(90)90004-6(Journal) (5559265-N)
==========================================================

Created: 2019-11-30 16:18:43
ConfID: 5559266
CauseID: 1459178525
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Chapman,2,2,117,1990,Focusing and collimation of X rays using microchannel plates: An experimental investigation
DOI: 10.1016/0895-3996(90)90005-7(Journal) (5559266-N)
==========================================================

Created: 2019-11-30 16:18:53
ConfID: 5559267
CauseID: 1459178532
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Murakami,2,2,127,1990,Thermal X-ray emission from ion-beam-heated matter
DOI: 10.1016/0895-3996(90)90006-8(Journal) (5559267-N)
==========================================================

Created: 2019-11-30 16:20:00
ConfID: 5559276
CauseID: 1459178594
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Eidmann,2,4,259,1990,Characterization of pinhole transmission gratings
DOI: 10.1016/0895-3996(90)90016-F(Journal) (5559276-N)
==========================================================

Created: 2019-11-30 16:20:08
ConfID: 5559277
CauseID: 1459178597
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Rarback,2,4,274,1990,Coherent radiation for x-ray imaging—The soft x-ray undulator and the X1A beamline at the NSLS
DOI: 10.1016/0895-3996(90)90017-G(Journal) (5559277-N)
==========================================================

Created: 2019-11-30 16:20:28
ConfID: 5559278
CauseID: 1459178614
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Nishimura,3,1,14,1991,Influence of exposure time on the sensitivity of Kodak 101 X-ray film
DOI: 10.1016/0895-3996(91)90008-T(Journal) (5559278-N)
==========================================================

Created: 2019-11-30 16:20:33
ConfID: 5559279
CauseID: 1459178621
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Puik,3,1,19,1991,Characterization of a multilayer coated laminar reflection grating at λ = 0.154 nm
DOI: 10.1016/0895-3996(91)90009-U(Journal) (5559279-N)
==========================================================

Created: 2019-11-30 16:19:33
ConfID: 5559272
CauseID: 1459178570
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Yao,2,3,195,1990,Synchrotron white beam topographic imaging in grazing Bragg-Laue geometries
DOI: 10.1016/0895-3996(90)90012-B(Journal) (5559272-N)
==========================================================

Created: 2019-11-30 16:19:38
ConfID: 5559273
CauseID: 1459178576
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Zegenhagen,2,3,214,1990,X-ray standing wave analysis of highly perfect Cu crystals and electrodeposited submonolayers of Cd and Tl on Cu surfaces
DOI: 10.1016/0895-3996(90)90013-C(Journal) (5559273-N)
==========================================================

Created: 2019-11-30 16:19:44
ConfID: 5559274
CauseID: 1459178580
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Gaponov,2,4,241,1990,Normal-incidence multilayer mirrors for the 120–450 Å wavelength region
DOI: 10.1016/0895-3996(90)90014-D(Journal) (5559274-N)
==========================================================

Created: 2019-11-30 16:19:53
ConfID: 5559275
CauseID: 1459178586
OtherID: 60987077
JT: Journal of X-Ray Science and Technology
MD: Elliott,2,4,249,1990,Application of X-ray microtomography in materials science illustrated by a study of a continuous fiber metal matrix composite
DOI: 10.1016/0895-3996(90)90015-E(Journal) (5559275-N)
==========================================================

Created: 2019-11-30 16:26:05
ConfID: 5559316
CauseID: 1459178894
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: CARROLL,4,4,323,1994,Use of monochromatic x rays in medical diagnosis and therapy what is it going to take?
DOI: 10.1016/S0895-3996(05)80049-7(Journal) (5559316-N)
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Created: 2019-11-30 16:26:10
ConfID: 5559317
CauseID: 1459178899
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: BOONE,4,4,334,1994,A figure of merit comparison between bremsstrahlung and monoenergetic x-ray sources for angiography
DOI: 10.1016/S0895-3996(05)80050-3(Journal) (5559317-N)
==========================================================

Created: 2019-11-30 16:26:19
ConfID: 5559318
CauseID: 1459178906
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: DONG,4,4,346,1994,Current status of the VU MFEL compton x-ray program
DOI: 10.1016/S0895-3996(05)80051-5(Journal) (5559318-N)
==========================================================

Created: 2019-11-30 16:26:28
ConfID: 5559319
CauseID: 1459178912
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: NELSON,4,4,353,1994,Large area image plane sensors for radiography
DOI: 10.1016/S0895-3996(05)80052-7(Journal) (5559319-N)
==========================================================

Created: 2019-11-30 16:25:30
ConfID: 5559312
CauseID: 1459178864
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: UMSTADTER,4,4,263,1994,Ultrashort ultraviolet free-electron lasers
DOI: 10.1016/S0895-3996(05)80044-8(Journal) (5559312-N)
==========================================================

Created: 2019-11-30 16:25:43
ConfID: 5559313
CauseID: 1459178875
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: HMELO,4,4,290,1994,Nondestructive evaluation of millimeter scale engineered structures using synchrotron x-ray microtomography
DOI: 10.1016/S0895-3996(05)80046-1(Journal) (5559313-N)
==========================================================

Created: 2019-11-30 16:25:49
ConfID: 5559314
CauseID: 1459178883
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: TOMPKINS,4,4,301,1994,Application of graphite mosaic monochromator crystals for x-ray transport
DOI: 10.1016/S0895-3996(05)80047-3(Journal) (5559314-N)
==========================================================

Created: 2019-11-30 16:25:58
ConfID: 5559315
CauseID: 1459178889
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: KIEFFER,4,4,312,1994,X-ray sources based on subpicosecond-laser-produced plasmas
DOI: 10.1016/S0895-3996(05)80048-5(Journal) (5559315-N)
==========================================================

Created: 2019-11-30 16:26:59
ConfID: 5559324
CauseID: 1459178941
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: STEAD,5,1,52,1995,The use of soft x rays to study the ultrastructure of living biological material
DOI: 10.1016/S0895-3996(05)80012-6(Journal) (5559324-N)
==========================================================

Created: 2019-11-30 16:27:08
ConfID: 5559325
CauseID: 1459178945
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: CHERNOV,5,1,65,1995,Study of the inner structure of Co/C and Ni/C multilayers prepared by pulsed laser evaporation method
DOI: 10.1016/S0895-3996(05)80013-8(Journal) (5559325-N)
==========================================================

Created: 2019-11-30 16:27:13
ConfID: 5559326
CauseID: 1459178951
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: YAAKOBI,5,1,73,1995,Monochromatic backlighting as a laser-fusion diagnostic
DOI: 10.1016/S0895-3996(05)80014-X(Journal) (5559326-N)
==========================================================

Created: 2019-11-30 16:27:24
ConfID: 5559327
CauseID: 1459178958
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: RIDGELEY,5,1,88,1995,An elliptical crystal spectrometer suitable for EXAFS studies of laser compressed materials and for high resolution x-ray spectroscopy
DOI: 10.1016/S0895-3996(05)80015-1(Journal) (5559327-N)
==========================================================

Created: 2019-11-30 16:26:33
ConfID: 5559320
CauseID: 1459178918
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: SHEALY,5,1,1,1995,Optical analysis of an ultra-high resolution two-mirror soft x-ray microscope
DOI: 10.1016/S0895-3996(05)80008-4(Journal) (5559320-N)
==========================================================

Created: 2019-11-30 16:26:40
ConfID: 5559321
CauseID: 1459178923
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: DURFEE,5,1,20,1995,Goldhelox: A soft x-ray solar telescope
DOI: 10.1016/S0895-3996(05)80009-6(Journal) (5559321-N)
==========================================================

Created: 2019-11-30 16:26:48
ConfID: 5559322
CauseID: 1459178927
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: GLUSKIN,5,1,29,1995,Soft x-ray instrumentation and its applications at the advanced photon source
DOI: 10.1016/S0895-3996(05)80010-2(Journal) (5559322-N)
==========================================================

Created: 2019-11-30 16:26:54
ConfID: 5559323
CauseID: 1459178936
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: PETERSON,5,1,43,1995,A capillary discharge as a potential x-ray laser driver
DOI: 10.1016/S0895-3996(05)80011-4(Journal) (5559323-N)
==========================================================

Created: 2019-11-30 16:23:33
ConfID: 5559300
CauseID: 1459178771
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: ZWICKER,4,1,57,1993,Analysis of impurity content and transport in tokamak plasmas using low-resolution XUV spectra
DOI: 10.1016/S0895-3996(05)80033-3(Journal) (5559300-N)
==========================================================

Created: 2019-11-30 16:23:54
ConfID: 5559301
CauseID: 1459178787
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: MUTIKAINEN,4,2,82,1994,Large-area pressure-enduring entrance windows for soft X-ray regime
DOI: 10.1016/S0895-3996(05)80020-5(Journal) (5559301-N)
==========================================================

Created: 2019-11-30 16:23:59
ConfID: 5559302
CauseID: 1459178795
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: TARRIO,4,2,96,1994,The new NIST/ARPA national soft X-ray reflectometry facility
DOI: 10.1016/S0895-3996(05)80021-7(Journal) (5559302-N)
==========================================================

Created: 2019-11-30 16:24:08
ConfID: 5559303
CauseID: 1459178800
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: ELLIOTT,4,2,102,1994,Application of scanning microradiography and X-ray microtomography to studies of bones and teeth
DOI: 10.1016/S0895-3996(05)80022-9(Journal) (5559303-N)
==========================================================

Created: 2019-11-30 16:22:54
ConfID: 5559296
CauseID: 1459178741
OtherID: 62721080
JT: Journal of X-Ray Science and Technology
MD: Burge,3,4,311,1992,X-ray microscopy at suboptical resolution: Direct observation of the 65-nm periodicity in collagen fibrils
DOI: 10.1016/0895-3996(92)90018-F(Journal) (5559296-N)
==========================================================

Created: 2019-11-30 16:23:03
ConfID: 5559297
CauseID: 1459178746
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: FILATOVA,4,1,1,1993,The anisotropy of X-ray reflection and scattering from hexagonal BN
DOI: 10.1016/S0895-3996(05)80028-X(Journal) (5559297-N)
==========================================================

Created: 2019-11-30 16:23:14
ConfID: 5559298
CauseID: 1459178753
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: LAWSON,4,1,18,1993,Flux maximization techniques for compton backscatter depth profilometry
DOI: 10.1016/S0895-3996(05)80030-8(Journal) (5559298-N)
==========================================================

Created: 2019-11-30 16:23:28
ConfID: 5559299
CauseID: 1459178767
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: TOMOV,4,1,44,1993,Picosecond X-ray pulses generated in a diode driven by 193-nm picosecond laser pulses
DOI: 10.1016/S0895-3996(05)80032-1(Journal) (5559299-N)
==========================================================

Created: 2019-11-30 16:24:58
ConfID: 5559308
CauseID: 1459178838
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: DAVIS,4,3,191,1994,The effect of linear interpolation of the filtered projections on image noise in x-ray computed tomography
DOI: 10.1016/S0895-3996(05)80057-6(Journal) (5559308-N)
==========================================================

Created: 2019-11-30 16:25:03
ConfID: 5559309
CauseID: 1459178841
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: BRIDOU,4,3,200,1994,Grazing x-ray reflectometry data processing by fourier transform
DOI: 10.1016/S0895-3996(05)80058-8(Journal) (5559309-N)
==========================================================

Created: 2019-11-30 16:25:09
ConfID: 5559310
CauseID: 1459178848
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: GEPPERT,4,3,217,1994,Application of structural phase transitions in x-ray spectroscopy
DOI: 10.1016/S0895-3996(05)80059-X(Journal) (5559310-N)
==========================================================

Created: 2019-11-30 16:25:23
ConfID: 5559311
CauseID: 1459178858
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: LUCCIO,4,4,247,1994,Coherent compton x-ray sources
DOI: 10.1016/S0895-3996(05)80043-6(Journal) (5559311-N)
==========================================================

Created: 2019-11-30 16:24:14
ConfID: 5559304
CauseID: 1459178804
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: SPILLER,4,2,118,1994,Diffraction-limited large X-ray optics
DOI: 10.1016/S0895-3996(05)80023-0(Journal) (5559304-N)
==========================================================

Created: 2019-11-30 16:24:34
ConfID: 5559305
CauseID: 1459178821
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: SAREEN,4,2,151,1994,Developments in X-ray detectors and associated electronics: A review of the technology and possible future trends
DOI: 10.1016/S0895-3996(05)80026-6(Journal) (5559305-N)
==========================================================

Created: 2019-11-30 16:24:43
ConfID: 5559306
CauseID: 1459178826
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: HAWRYLUK,4,3,167,1994,Power loading limitations in soft x-ray projection lithography
DOI: 10.1016/S0895-3996(05)80055-2(Journal) (5559306-N)
==========================================================

Created: 2019-11-30 16:24:50
ConfID: 5559307
CauseID: 1459178833
OtherID: 204578876
JT: Journal of X-Ray Science and Technology
MD: VIITANEN,4,3,182,1994,Comparison of ultrathin x-ray window designs
DOI: 10.1016/S0895-3996(05)80056-4(Journal) (5559307-N)
==========================================================

Created: 2019-11-30 16:28:03
ConfID: 5559332
CauseID: 1459178992
OtherID: 166608353
JT: Journal of X-Ray Science and Technology
MD: MEDENWALDT,5,2,202,1995,Production of ultra thin silicon foils
DOI: 10.1016/S0895-3996(05)80003-5(Journal) (5559332-N)
==========================================================

Created: 2019-11-30 16:28:18
ConfID: 5559333
CauseID: 1459179004
OtherID: 166608353
JT: Journal of X-Ray Science and Technology
MD: LEHNERT,5,2,221,1995,Ray tracing for crystal-diffraction spectrometers with position-sensitive detectors
DOI: 10.1016/S0895-3996(05)80005-9(Journal) (5559333-N)
==========================================================

Created: 2019-11-30 16:28:23
ConfID: 5559334
CauseID: 1459179007
OtherID: 166608353
JT: Journal of X-Ray Science and Technology
MD: JORDAN,5,2,228,1995,Entrance window design parameters for high-pressure gas x-ray imaging detectors
DOI: 10.1016/S0895-3996(05)80006-0(Journal) (5559334-N)
==========================================================

Created: 2019-11-30 16:29:34
ConfID: 5559335
CauseID: 1459179069
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: FRAENKEL,5,4,341,1995,Multiple reflections in single crystals as a tool for X-ray spectroscopy
DOI: 10.1016/S0895-3996(85)80001-X(Journal) (5559335-N)
==========================================================

Created: 2019-11-30 16:27:29
ConfID: 5559328
CauseID: 1459178966
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: DAIDO,5,1,105,1995,Subnanosecond in-line soft x-ray holography using germanium laser in the 20 nm wavelength region
DOI: 10.1016/S0895-3996(05)80016-3(Journal) (5559328-N)
==========================================================

Created: 2019-11-30 16:27:34
ConfID: 5559329
CauseID: 1459178970
OtherID: 176448304
JT: Journal of X-Ray Science and Technology
MD: DIEHL,5,1,121,1995,Microstructural and chemical characterization of the inconel/Ti(N) thin film and multilayer system
DOI: 10.1016/S0895-3996(05)80017-5(Journal) (5559329-N)
==========================================================

Created: 2019-11-30 16:27:48
ConfID: 5559330
CauseID: 1459178979
OtherID: 166608353
JT: Journal of X-Ray Science and Technology
MD: BAC,5,2,161,1995,Theoretical and experimental investigation of X-ray diffraction by a lamellar multilayer amplitude grating
DOI: 10.1016/S0895-3996(05)80001-1(Journal) (5559330-N)
==========================================================

Created: 2019-11-30 16:27:54
ConfID: 5559331
CauseID: 1459178985
OtherID: 166608353
JT: Journal of X-Ray Science and Technology
MD: GIAKOS,5,2,181,1995,Engineering aspects of a kinestatic charge detector
DOI: 10.1016/S0895-3996(05)80002-3(Journal) (5559331-N)
==========================================================

Created: 2019-11-30 16:29:39
ConfID: 5559336
CauseID: 1459179073
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: PAHL,5,4,368,1995,A crystal camera for ultra-small-angle x-ray scattering using synchrotron radiation
DOI: 10.1016/S0895-3996(85)80002-1(Journal) (5559336-N)
==========================================================

Created: 2019-11-30 16:29:48
ConfID: 5559337
CauseID: 1459179082
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: PONOMAREV,5,4,379,1995,ReflEXAFS spectroscopy of thin Fe/Sc multilayers
DOI: 10.1016/S0895-3996(85)80003-3(Journal) (5559337-N)
==========================================================

Created: 2019-11-30 16:29:54
ConfID: 5559338
CauseID: 1459179087
OtherID: 207083168
JT: Journal of X-Ray Science and Technology
MD: CHERNOV,5,4,389,1995,Structural changes study of Co/C and Ni/C multilayers upon annealing
DOI: 10.1016/S0895-3996(85)80004-5(Journal) (5559338-N)