Report date: Mar 10,2026
Conflict count: 373043
Publisher: Oxford University Press
Title count: 247
Conflict count: 14615


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Created: 2026-02-27 12:41:17
ConfID: 8666256
CauseID: 1735074943
OtherID: 1734060770
JT: Microscopy Today
MD: Vieira,,,,2026,Low-Voltage Electron Microscopy (LVEM) Part III: Enhancing Undergraduate Training and Research Participation
DOI: 10.1093/mictod/qaag020(Journal) (8666256-N)
DOI: 10.1093/mictod/qaag017(Journal)